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IC Test Socket

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IC Test Socket

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Product Details:

Place of Origin:	Guangdong, China
Brand Name:	Yiding
Certification:	ISO9001:2015, Rohs,etc.

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Detailed Product Description

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IC test socket with warranty

IC test socket for electronics

durable IC test socket

IC Test Socket

Understanding Test Sockets

A test socket is an IC socket specifically designed to measure the electrical characteristics of semiconductor devices and verify compliance with required specifications. Based on application requirements, test sockets are generally categorized into two primary types:

Functional testing sockets for mass-production lines - Used during post-processing stages of semiconductor manufacturing
Characteristic evaluation sockets for development stages - Utilized for assessing performance of first-article or prototype devices

Test Socket vs. Burn-In Socket Comparison

Unlike test sockets, burn-in sockets are engineered for long-duration accelerated testing under powered conditions to evaluate product durability and reliability. Burn-in sockets must withstand high-temperature environments and are typically soldered directly onto boards, making them non-replaceable. In contrast, test sockets are used throughout mass-production processes and feature surface-mount or screw-secured mounting for easy maintenance and replacement.

Flexible Semi-Customized Test Solutions

Our semi-customized test sockets and contactors offer adaptable, cost-effective testing solutions tailored to your specific requirements:

Semi-customized test sockets and contactors
Base designs easily adapted to meet specific requirements
Cost-effective customized test solutions
Multiple configurations: clamshell, open-top, top-opening, and separate-lid designs
Support for non-standard and irregular device sizes

Tag:

semiconductor test socket,

testing socket,

semiconductor socket

Contact Details

Dongguan Yiding Technologies Co., Ltd.

Contact Person: Stacey

Tel: 8618813380923

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Material Specification: Stainless Steel 17-4PH (standard), Beryllium Copper (high-cycle), Titanium (lightweight); optional nickel or gold plating.

Dimensional Tolerances: Critical Features – ±0.005 mm (device alignment); Overall Body – ±0.02 mm

Flatness/Coplanarity: ≤0.01 mm across seating surface (ensures uniform contact pressure).

Pin/Lead Channel Width & Depth: Width – ±0.003 mm; Depth – ±0.005 mm (adjustable for lead deflection).

Customization Precision Machined Semiconductor Test Socket High Performance

Material Specification: Stainless Steel 17-4PH (standard), Beryllium Copper (high-cycle), Titanium (lightweight); optional nickel or gold plating.

Dimensional Tolerances: Critical Features – ±0.005 mm (device alignment); Overall Body – ±0.02 mm

Flatness/Coplanarity: ≤0.01 mm across seating surface (ensures uniform contact pressure).

Pin/Lead Channel Width & Depth: Width – ±0.003 mm; Depth – ±0.005 mm (adjustable for lead deflection).

Semiconductor Industry IC Test Socket With 1.5mm Ultra Short Probe