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Stable Transmission IC Test Sockets Semiconductors Industry Testing Socket

Large Image : Stable Transmission IC Test Sockets Semiconductors Industry Testing Socket

Product Details:

Place of Origin:	Guangdong, China
Brand Name:	Yiding
Certification:	ISO 9001

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Detailed Product Description

Highlight:

IC Test Sockets Semiconductors Industry

Semiconductors Industry Testing Socket

Stable Transmission IC Test Sockets

IC Test Socket

Leading Semiconductor Brand — Yiding Technologies

In the fast-evolving semiconductor industry, Yiding Technologies stands at the forefront with precision engineering and innovative solutions, delivering high-frequency test sockets and comprehensive semiconductor application services.

Our Services

Semiconductor Manufacturing & Processing
Test Fixtures & Spring Probes
Vertical Probe Cards
High-Frequency Test Socket
Automated Test Equipment

Technical Advantages

Through advanced needle design and surface treatment, Seiken probes deliver:

Stable signal transmission
Flexible probe configurations
Durability with minimal deformation

Leveraging our unique precision machining and assembly technology, we achieved a breakthrough with the development of the ultra-short 1.5 mm probe — a milestone previously unattainable. This innovation overcomes the challenges of high-frequency testing and expands the possibilities of general probe-type test socket applications worldwide.

Yiding Technology — Driving the future of semiconductor testing with precision and innovation.

Tag:

semiconductor test socket,

testing socket,

semiconductor socket

Contact Details

Dongguan Yiding Technologies Co., Ltd.

Contact Person: Stacey

Tel: 8618813380923

Other Products

Burr Free Semiconductor Test Sockets With Tight Tolerance Precision Engineering

Material Specification: Stainless Steel 17-4PH (standard), Beryllium Copper (high-cycle), Titanium (lightweight); optional nickel or gold plating.

Dimensional Tolerances: Critical Features – ±0.005 mm (device alignment); Overall Body – ±0.02 mm

Flatness/Coplanarity: ≤0.01 mm across seating surface (ensures uniform contact pressure).

Pin/Lead Channel Width & Depth: Width – ±0.003 mm; Depth – ±0.005 mm (adjustable for lead deflection).

Customization Precision Machined Semiconductor Test Socket High Performance

Material Specification: Stainless Steel 17-4PH (standard), Beryllium Copper (high-cycle), Titanium (lightweight); optional nickel or gold plating.

Dimensional Tolerances: Critical Features – ±0.005 mm (device alignment); Overall Body – ±0.02 mm

Flatness/Coplanarity: ≤0.01 mm across seating surface (ensures uniform contact pressure).

Pin/Lead Channel Width & Depth: Width – ±0.003 mm; Depth – ±0.005 mm (adjustable for lead deflection).

Semiconductor Industry IC Test Socket With 1.5mm Ultra Short Probe