Critical Features – ±0.005 Mm (device Alignment); Overall Body – ±0.02 Mm
Flatness/Coplanarity:
≤0.01 Mm Across Seating Surface (ensures Uniform Contact Pressure).
Pin/Lead Channel Width & Depth:
Width – ±0.003 Mm; Depth – ±0.005 Mm (adjustable For Lead Deflection).
Pin/Lead Channel Pitch Accuracy:
±0.005 Mm (fine-pitch ICs), ±0.01 Mm (standard).
Highlight:
Burr Free Semiconductor Test Sockets
,
tight Tolerance Semiconductor Test Sockets
,
precision engineering semiconductor socket
Product Description
Semiconductor Test Socket Guide
Product Overview
The Semiconductor Test Socket Guide is engineered to deliver consistent performance across thousands of test insertions. By controlling vertical axis movement, it prevents off-axis actuation that can cause uneven contact force or premature probe wear. Precision-machined guide holes with chamfered lead-ins and optimized clearance profiles ensure smooth compression of pogo pins. The result is repeatable contact resistance, extended socket life, and superior reliability in high-throughput ATE environments.
Surface & Finish
Contact Channels: Ra ≤ 0.2 µm (mirror finish)
Non-Contact Surfaces: Ra ≤ 0.8 µm
Burr-Free: Micro-deburred edges, ISO 13715 compliant
Protective Coatings & Plating Options
Hard-coat anodizing (Aluminum)
Electroless Nickel (50-100 µin)
Gold Flash (0.1-0.3 µin) for enhanced conductivity
Cleanliness & Packaging
Class 100 cleanroom packaging
Non-volatile residue <5 µg/cm²
Ion-free option available
Certifications
ISO 9001:2015 | IPC-9592 (High-Reliability) | MIL-STD-883
Technical Advantages
Built from CTE-matched polymers or ceramic-filled compounds for resistance to thermal distortion
Maintains dimensional stability at temperatures >150 °C during HTOL and burn-in procedures
Prevents warping, misalignment, or probe disengagement under thermal cycling
Designed for >100,000 insertions with high-hardness composites and abrasion-resistant materials
PTFE fillers or dry-film coatings reduce friction, galling, and particle generation
With its precision engineering, the Semiconductor Test Socket Guide ensures dimensional integrity, long-term durability, and reliable test results — even under demanding mechanical and thermal conditions.
